QEM - Quantitative Electron Microscopy - is an international event (from 22th May to 2nd June 2017) dedicated to advanced techniques and quantitative measurements in Transmission Electron Microscopy. It covers theoretical and practical aspects of most of the investigation techniques available in TEM together with their recent developments: conventional and scanning high resolution imaging, holography, tomography, quantitative electron diffraction, energy loss spectroscopy and energy dispersive X-ray analysis, environmental and in-situ.